Erik J Kielin

USPTO Patent Examiner·Active 2012 to 2013

Erik J Kielin is a USPTO patent examiner who has handled 12 ex parte reexaminations between 2012 and 2013. These reexams concentrate in Electrical & Electronic, Mechanical Engineering, and Chemistry & Materials. ExamPat indexes the full prosecution record for each of these cases, including office-action grounds, certificate outcomes, and downstream PTAB and federal-circuit decisions.

Filings by year

5
12
7
13

Technology mix

Electrical & Electronic8 (67%)
Mechanical Engineering2 (17%)
Chemistry & Materials1 (8%)
Physics & Instruments1 (8%)

Compare against all examiners

Eight side-by-side metrics: case volume, pendency, OAs per reexam, rejection mix, SNQ denial rate, certification rate, and PTAB appeal rate, with a Δ column showing where this examiner runs higher or lower than the corpus.

  • Average and median pendency, both for this examiner and the corpus
  • Rejection basis split (102 / 103 / 112) head-to-head
  • Certification, SNQ denial, and PTAB appeal rates

Certificate outcome distribution

How this examiner's certificates split across the six possible outcomes: all claims confirmed, confirmed with amendment, confirmed with new claims, mixed, or all claims canceled. Includes share comparison to the corpus distribution.

  • Count and share for each of the six outcome buckets
  • Δ vs. corpus distribution in percentage points
  • Useful for setting realistic patent-owner expectations

Event-to-event timing

Median time for this examiner's cases at each prosecution stage, from filing to first office action, filing to NIRC, and filing to certificate, with corpus comparison and sample size.

  • Median in months per transition
  • Side-by-side with the corpus median
  • n column showing how many of this examiner's cases completed each transition

vs. all examiners

Certificate outcome distribution

Event-to-event timing (median)

Recent reexaminations (12)

Control #FiledPatentTitlePendencyStatus
90/013,081Dec 5, 20135,684,863Telephonic-Interface Statistical Analysis System6 moClosed
90/020,046Nov 19, 20137,745,814POLYCHROMATIC LED'S AND RELATED SEMICONDUCTOR DEVICES11 moClosed
90/020,038Nov 19, 20137,719,020(AL,GA,IN)N AND ZNO DIRECT WAFER BONDED STRUCTURE FOR OPTOELECTRONIC APPLICATIONS, AND ITS FABRICATION METHOD10 moClosed
90/020,045Nov 19, 20137,749,780POLYMER OPTOELECTRONIC DEVICE AND METHODS FOR MAKING THE SAME10 moClosed
90/020,041Nov 19, 20137,737,434LIGHT-EMITTING DIODE ILLUMINATION SOURCE6 moClosed
90/012,959Aug 27, 20136,634,770LIGHT SOURCE USING SEMICONDUCTOR DEVICES MOUNTED ON A HEAT SINK12 moClosed
90/012,957Aug 26, 20136,465,961SEMICONDUCTOR LIGHT SOURCE USING A HEAT SINK WITH A PLURALITY OF PANELS12 moClosed
90/012,730Dec 3, 20128,026,479Systems and Methods for Analyzing Substances Using a Mass Spectrometer11 moClosed
90/012,480Sep 10, 20125,672,535METHOD OF FABRICATING DRAM CELL WITH SELF-ALIGNED CONTACT9 moClosed
90/012,250Apr 11, 20126,908,316ELECTRICAL CONNECTOR WITH ACCURATE MEASURING BENCHMARKS27 moClosed
90/012,162Feb 24, 20126,403,980THIN FILM TRANSISTOR ARRAY PANEL FOR LIQUID CRYSTAL DISPLAY18 moClosed
90/012,077Jan 5, 20125,672,535METHOD OF FABRICATION DRAM CELL WITH SELF-ALIGNED CONTACT17 moClosed

Get the full reexam analytics

Compare Erik J Kielin against the full corpus, see the certificate-outcome split, drill into event timing, filter the case list, and export. Free to sign up.