ExamPat

Leonardo Andujar

USPTO Patent Examiner·Active 2012 to 2026

Leonardo Andujar is a USPTO patent examiner who has handled 54 ex parte reexaminations between 2012 and 2026, with 18 currently open. These reexams concentrate in Electrical & Electronic, Mechanical & Manufacturing, and Physics & Instruments. ExamPat indexes the full prosecution record for each of these cases, including office-action grounds, certificate outcomes, and downstream PTAB and federal-circuit decisions.

Filings by year

3
12
5
13
1
14
2
15
1
19
1
20
4
21
3
22
7
23
4
24
8
25
15
26

Technology mix

Electrical & Electronic40 (74%)
Mechanical & Manufacturing7 (13%)
Physics & Instruments4 (7%)
Chemistry & Materials2 (4%)
Life Sciences & Consumer1 (2%)

Compare against all examiners

Eight side-by-side metrics: case volume, pendency, OAs per reexam, rejection mix, SNQ denial rate, certification rate, and PTAB appeal rate, with a Δ column showing where this examiner runs higher or lower than the corpus.

  • Average and median pendency, both for this examiner and the corpus
  • Rejection basis split (102 / 103 / 112) head-to-head
  • Certification, SNQ denial, and PTAB appeal rates

Certificate outcome distribution

How this examiner's certificates split across the six possible outcomes: all claims confirmed, confirmed with amendment, confirmed with new claims, mixed, or all claims canceled. Includes share comparison to the corpus distribution.

  • Count and share for each of the six outcome buckets
  • Δ vs. corpus distribution in percentage points
  • Useful for setting realistic patent-owner expectations

Event-to-event timing

Median time for this examiner's cases at each prosecution stage, from filing to first office action, filing to NIRC, and filing to certificate, with corpus comparison and sample size.

  • Median in months per transition
  • Side-by-side with the corpus median
  • n column showing how many of this examiner's cases completed each transition

vs. all examiners

Certificate outcome distribution

Event-to-event timing (median)

Recent reexaminations (showing 25 of 54)

View all in dashboard →
Control #FiledPatentTitlePendencyStatus
90/016,347May 28, 202610,151,658PRESSURE-SENSING INTEGRATED CIRCUIT DEVICE WITH DIAPHRAGM—Open
90/016,327May 21, 202612,094,767BARRIER LAYERS FOR WORD LINE CONTACTS IN A THREE-DIMENSIONAL NAND MEMORY AND FABRICATION METHODS THEREOF—Open
90/016,322May 20, 202612,035,5313D SEMICONDUCTOR DEVICE AND STRUCTURE WITH LOGIC AND MEMORY—Open
90/016,311May 19, 202611,594,4733D SEMICONDUCTOR DEVICE AND STRUCTURE WITH METAL LAYERS AND A CONNECTIVE PATH—Open
90/016,289May 15, 20267,554,126SEMICONDUCTOR LIGHT-EMITTING ELEMENT, MANUFACTURING METHOD AND MOUNTING METHOD OF THE SAME AND LIGHT-EMITTING DEVICE—Open
90/016,219Apr 29, 20266,774,033METAL STACK FOR LOCAL INTERCONNECT LAYER—Open
90/016,157Apr 3, 202610,181,462SEMICONDUCTOR DEVICE, DISPLAY DEVICE, AND ELECTRONIC APPARATUS—Open
90/016,097Mar 29, 202611,968,909METHOD OF MANUFACTURING A MAGNETORESISTIVE RANDOM ACCESS MEMORY (MRAM)—Closed
90/016,057Mar 18, 20269,299,646LEAD FRAME WITH POWER AND GROUND BARS—Open
90/015,967Feb 17, 20268,314,547OPTO-ELECTRONIC COMPONENT—Closed
90/015,903Feb 6, 20269,564,433Semiconductor Device with Improved Contact Structure and Method of Forming Same—Open
90/015,942Feb 3, 20268,329,572SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME—Open
90/015,904Jan 26, 20269,564,433Semiconductor Device with Improved Contact Structure and Method of Forming Same—Open
90/015,892Jan 22, 20267,514,757MEMORY FORMATION WITH REDUCED METALLIZATION LAYERS—Open
90/015,859Jan 13, 20267,476,957SEMICONDUCTOR INTEGRATED CIRCUIT—Open
90/015,752Dec 3, 20259,147,747SEMICONDUCTOR STRUCTURE WITH HARD MASK DISPOSED ON THE GATE STRUCTURE—Open
90/015,692Nov 14, 20258,796,779SEMICONDUCTOR DEVICE—Open
90/015,666Nov 7, 20258,063,369BOLOMETER ELEMENT, BOLOMETER CELL, BOLOMETER CAMERA AND METHOD—Open
90/015,640Oct 28, 202511,479,462Hydrocarbon Reforming Processes with Shaft Power Production—Open
90/015,566Oct 1, 202511,929,191METHOD FOR MANUFACTURING MAGNETIC DATA LINE—Open
90/015,373Jul 10, 20259,070,755Transistor Having Elevated Drain Finger Termination—Open
90/019,939Apr 30, 202511,207,280EPINEPHRINE COMPOSITIONS AND CONTAINERS9 moClosed
90/019,844Feb 10, 202511,478,773EVAPORATIVE EMISSION CONTROL ARTICLES INCLUDING ACTIVATED CARBON11 moClosed
90/019,681Sep 27, 202411,355,264METHOD OF MANUFACTURING ELECTRICAL CABLE, AND RESULTING PRODUCT, WITH REDUCED REQUIRED INSTALLATION PULLING FORCE15 moClosed
90/019,678Sep 24, 202411,011,285METHOD OF MANUFACTURING ELECTRICAL CABLE, AND RESULTING PRODUCT, WITH REDUCED REQUIRED INSTALLATION PULLING FORCE14 moClosed

Other USPTO reexam examiners

Get the full reexam analytics

Compare Leonardo Andujar against the full corpus, see the certificate-outcome split, drill into event timing, filter the case list, and export. Free to sign up.