ExamPat

Christina Y Leung

USPTO Patent Examiner·Active 2012 to 2026

Christina Y Leung is a USPTO patent examiner who has handled 48 ex parte reexaminations between 2012 and 2026, with 23 currently open. These reexams concentrate in Electrical & Electronic, Physics & Instruments, and Mechanical & Manufacturing. ExamPat indexes the full prosecution record for each of these cases, including office-action grounds, certificate outcomes, and downstream PTAB and federal-circuit decisions.

Filings by year

6
12
2
13
3
14
2
16
2
17
2
20
1
21
1
22
1
23
13
25
16
26

Technology mix

Electrical & Electronic21 (43%)
Physics & Instruments19 (39%)
Mechanical & Manufacturing4 (8%)
Mechanical Engineering2 (4%)
Life Sciences & Consumer2 (4%)
Chemistry & Materials1 (2%)

Compare against all examiners

Eight side-by-side metrics: case volume, pendency, OAs per reexam, rejection mix, SNQ denial rate, certification rate, and PTAB appeal rate, with a Δ column showing where this examiner runs higher or lower than the corpus.

  • Average and median pendency, both for this examiner and the corpus
  • Rejection basis split (102 / 103 / 112) head-to-head
  • Certification, SNQ denial, and PTAB appeal rates

Certificate outcome distribution

How this examiner's certificates split across the six possible outcomes: all claims confirmed, confirmed with amendment, confirmed with new claims, mixed, or all claims canceled. Includes share comparison to the corpus distribution.

  • Count and share for each of the six outcome buckets
  • Δ vs. corpus distribution in percentage points
  • Useful for setting realistic patent-owner expectations

Event-to-event timing

Median time for this examiner's cases at each prosecution stage, from filing to first office action, filing to NIRC, and filing to certificate, with corpus comparison and sample size.

  • Median in months per transition
  • Side-by-side with the corpus median
  • n column showing how many of this examiner's cases completed each transition

vs. all examiners

Certificate outcome distribution

Event-to-event timing (median)

Recent reexaminations (showing 25 of 48)

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Control #FiledPatentTitlePendencyStatus
90/016,440Jul 1, 202612,266,403THREE-DIMENSIONAL NAND MEMORY AND FABRICATION METHOD THEREOF—Open
90/016,400Jun 17, 20267,555,357METHOD FOR BUILDING THREE-DIMENSIONAL OBJECTS WITH EXTRUSION-BASED LAYERED DEPOSITION SYSTEMS—Open
90/016,334May 22, 20268,809,940FIN FIELD EFFECT TRANSISTOR—Open
90/016,335May 22, 20269,716,091FIN FIELD EFFECT TRANSISTOR—Open
90/016,328May 21, 202611,342,214METHODS FOR PRODUCING A 3D SEMICONDUCTOR MEMORY DEVICE AND STRUCTURE—Open
90/016,329May 21, 202611,862,503METHOD FOR PRODUCING A 3D SEMICONDUCTOR DEVICE AND STRUCTURE WITH MEMORY CELLS AND MULTIPLE METAL LAYERS—Open
90/016,232May 1, 20268,440,517FINFET AND METHOD OF FABRICATING THE SAME—Open
90/016,213Apr 27, 20269,209,300FIN FIELD EFFECT TRANSISTOR—Open
90/016,214Apr 27, 20269,379,215FIN FIELD EFFECT TRANSISTOR—Open
90/016,164Apr 4, 20267,705,948LIQUID CRYSTAL DISPLAY DEVICE—Open
90/016,099Mar 30, 202612,068,2503D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME—Open
90/016,044Mar 12, 20268,400,835NON-VOLATILE SEMICONDUCTOR MEMORY—Closed
90/016,025Mar 5, 202612,087,871MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICES—Closed
90/015,962Feb 13, 202611,621,360MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICES—Open
90/015,945Feb 3, 202610,468,543MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICES—Open
90/015,944Feb 3, 202610,446,700MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICES—Open
90/015,821Dec 23, 20259,055,868SYSTEM AND METHOD FOR VOICE CONTROL OF MEDICAL DEVICES—Open
90/015,812Dec 22, 20258,506,122LENS AND LIGHT EMITTING APPARATUS HAVING THE SAME—Open
90/015,810Dec 22, 20259,534,744LIGHT EMITTING APPARATUS—Open
90/015,552Dec 4, 20256,291,861SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING THE SAME—Open
90/015,751Dec 3, 20259,184,292SEMICONDUCTOR STRUCTURE WITH DIFFERENT FINS OF FINFETS—Open
90/015,691Nov 19, 20257,923,764SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME—Open
90/015,689Nov 14, 20257,579,227SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME—Open
90/015,690Nov 14, 20258,587,076SEMICONDUCTOR DEVICE—Open
90/015,688Nov 14, 20258,253,180SEMICONDUCTOR DEVICE—Open

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