ExamPat

ADVANCED DATA ACCESS LLC

Patent owner in reexamination·6 ex parte reexams

ADVANCED DATA ACCESS LLC's patents have been the subject of 6 USPTO ex parte reexaminations. Its patents are most often challenged by Micron Technology, Inc.. ExamPat indexes the full prosecution record for each proceeding, including office-action grounds, certificate outcomes, and downstream PTAB and Federal Circuit decisions.

Filings by year

6
12

Top requesters

Outcome track record

How reexams of this owner's patents resolve: claims confirmed, amended, mixed, or fully canceled.

  • Certificate outcome split across every bucket
  • Claim-survival rate

Defense metrics

Claim-survival rate, average pendency, and the open/closed split across every reexam of this owner's patents.

  • Survival rate of closed proceedings
  • Average pendency in months

Challengers & examiners

Which requesters most often challenge this owner's patents, and which examiners decide them.

  • Top requesters
  • Most frequent examiners

Recent reexaminations (6)

Control #FiledPatentTitleRequesterStatus
90/012,703Oct 12, 20125,781,497RANDOM ACCESS MEMORY WORD LINE SELECT CIRCUIT HAVING RAPID DYNAMIC DESELECTMicron Technology, Inc.Closed
90/012,480Sep 10, 20125,672,535METHOD OF FABRICATING DRAM CELL WITH SELF-ALIGNED CONTACTMicron Technology, Inc.Closed
90/012,143Feb 14, 20125,781,497Random Access Memory Word Line Select Circuit Having Rapid Dynamic Deselect—Closed
90/012,076Jan 5, 20125,671,188RANDOM ACCESS MEMORY HAVING SELECTIVE INTRA-BANK FAST ACTIVATION OF SENSE AMPLIFIER—Closed
90/012,077Jan 5, 20125,672,535METHOD OF FABRICATION DRAM CELL WITH SELF-ALIGNED CONTACT—Closed
90/012,078Jan 5, 20125,781,497RANDOM ACCESS MEMORY WORD LINE SELECT CIRCUIT HAVING RAPID DYNAMIC DESELECT—Closed

Other patent owners

See the full reexam picture for ADVANCED DATA ACCESS LLC

Certificate outcomes, pendency, and the parties and examiners behind these cases. Free to sign up.